{"schemaVersion":"maha-epistemic/1.0","evidencePolicyVersion":"mps/0.1","generatedAt":"2026-08-24T00:00:00.000Z","domain":{"slug":"advanced-materials","name":"Advanced materials","description":"Two-dimensional materials, moiré systems, topological phases, wide-bandgap substrates, interfaces, fabrication, and metrology under specimen-specific contracts.","stressPoint":"A property observed in one flake, stack, temperature range, or device geometry cannot be transferred to wafer-scale yield or product performance.","accent":"violet"},"lifecycle":{"status":"adversarial-pilot","foundationalTarget":30,"canonicalFactoryRecords":0,"outstandingFactoryRecords":30},"counts":{"graphRecords":30,"graphEdges":34,"publicCanonicalRecords":0,"withheldRecords":30},"records":[],"withheldInventory":{"recordCount":30,"edgeCount":34,"recordKinds":{"comparison":6,"concept":6,"measurement":6,"mechanism":6,"method":6},"disclosure":"aggregate-only"},"boundary":"Only active canonical records are enumerated. Draft identifiers, titles, paths, claims, sources, and gate reasons remain private until canonical release."}